David L Ray

US Patent:

6415654, Jul 9, 2002

Filed:

Oct 30, 2000

Appl. No.:

09/699803

Inventors:

David J. Ray - Agoura Hills CA 91301

International Classification:

G01B 528

US Classification:

73105

Abstract:

A scanning force microscope system that employs a laser ( ) and a probe assembly ( ) mounted in a removable probe illuminator assembly ( ), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever ( ) after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly ( ) supports a scanning probe microscope ( ). Scanning probe microscope ( ) holds a removable probe sensor assembly ( ). Removable probe sensor assembly ( ) may be transported and conveniently attached to the adjustment station ( ) where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly ( ) may then be attached to the scanning probe microscope ( ).

US Patent:

6748794, Jun 15, 2004

Filed:

Jul 7, 2002

Appl. No.:

10/190404

Inventors:

David James Ray - Agoura Hills CA 91301

International Classification:

G01B 528

US Classification:

73105, 250306, 250307

Abstract:

A scanning force microscope system that employs a laser ( ) and a probe assembly ( ) mounted in a removable probe illuminator assembly ( ), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever ( ) after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly ( ) supports a scanning probe microscope ( ). Scanning probe microscope ( ) holds a removable probe sensor assembly ( ). Removable probe sensor assembly ( ) may be transported and conveniently attached to the adjustment station ( ) where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly ( ) may then be attached to the scanning probe microscope ( ).

US Patent:

6910368, Jun 28, 2005

Filed:

Aug 10, 2004

Appl. No.:

10/850932

Inventors:

David J Ray - Agoura Hills CA, US

Assignee:

Raymax Technology, Inc. - Agoura Hills CA

International Classification:

G01N013/16
G01B005/28

US Classification:

73105

Abstract:

A scanning force microscope system that employs a laser () and a probe assembly () mounted in a removable probe illuminator assembly (), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever () after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly () supports a scanning probe microscope (). Scanning probe microscope () holds a removable probe sensor assembly (). Removable probe sensor assembly () may be transported and conveniently attached to the adjustment station () where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly () may then be attached to the scanning probe microscope ().

US Patent:

7692138, Apr 6, 2010

Filed:

Oct 19, 2007

Appl. No.:

11/975548

Inventors:

David James Ray - Agoura Hills CA, US
Nicholas Gregory Doe - San Ramon CA, US
Terence Rogers Lundy - Bolinas CA, US

International Classification:

G01B 5/28

US Classification:

250234, 250216, 250235

Abstract:

A combination confocal and scanning probe microscope system permits accurate location of a sample within the field of view as the sample translates from one type of microscope to the other. Alternate embodiments permit both microscopes to view the same sample location at the same time. Further alternate embodiments include a confocal and a probe microscope integrated into a common optical path.

US Patent:

20070144244, Jun 28, 2007

Filed:

Dec 20, 2006

Appl. No.:

11/643449

Inventors:

David Ray - Agoura Hills CA, US

International Classification:

G01N 13/10
G01N 13/12
G12B 21/20

US Classification:

073105000, 250306000, 250307000

Abstract:

A scanning probe microscope comprises a probe module. In some embodiments the module is easily removed from the lateral and vertical scanning mechanisms. The module further comprises one or more vertical motion actuator that may be controlled by a multi-path feedback control loop. By coupling the second vertical motion actuator directly to the probe the speed of the scan may be increased over the speed of prior art microscopes. The feedback loop is part of the probe microscope and feedback paths may be independently designed to create independent control of multiple paths.

US Patent:

46492674, Mar 10, 1987

Filed:

Apr 26, 1984

Appl. No.:

6/604325

Inventors:

David J. Ray - San Juan Capistrano CA

Assignee:

ILC Technology, Inc. - Sunnyvale CA

International Classification:

G01J 132
G01D 534

US Classification:

250205

Abstract:

A gain control circuit for a light source in an optical encoder derives a signal from the phototransducers that receive the light through the encoder disc. In one embodiment, a signal is taken between the transducer and potential source and in alternative embodiments the signal is taken from the phototransducer output. If a periodic index pulse is generated, a correcting circuit compensates for its effect. Where all of the transducers do not receive a substantially constant continuing illumination level, a filter-integrator circuit provides the d. c. component to the gain control circuit.

US Patent:

56147120, Mar 25, 1997

Filed:

Mar 24, 1995

Appl. No.:

8/409999

Inventors:

David J. Ray - Agoura Hills CA

Assignee:

Quesant Instrument Corporation - Agoura Hills CA

International Classification:

H01J 3728

US Classification:

250307

Abstract:

A method for initially positioning the scanning probe of a scanning probe microscope includes the steps of initially using fine position control to reduce the distance between probe and sample and, if the sample surface is not encountered, reversing the direction of the fine position control to an intermediate position and then using a coarse control in predetermined increments to narrow the distance between the probe and the sample. The fine control is again used and if the sample surface is not encountered, the steps are repeated until the surface is encountered so that the scanning operation can commence.

US Patent:

54669359, Nov 14, 1995

Filed:

Jan 20, 1995

Appl. No.:

8/377025

Inventors:

David J. Ray - Agoura Hills CA
Robert S. Harp - Westlake Village CA

Assignee:

Quesant Instrument Corporation - Agoura Hills CA

International Classification:

H01J 3728

US Classification:

250307

Abstract:

Scanned-probe microscope systems (20, 140) are disclosed with analog control loops (24, 144) that can be electronically programmed to select from a plurality of transfer functions. The amplitude of the control loop reference signal (64) can also be electronically programmed. A controller (26) enables an operator to quickly program these operational characteristics. The controller preferably includes a visual display (33) and a recording device (32) to facilitate the programming and to display and store the scanning data obtained with the selected characteristics.

Author:

David Ray

ISBN #:

0312155271

Author:

David Ray

ISBN #:

0312209649

Author:

David Ray

ISBN #:

0517594269

Author:

David Ray

ISBN #:

0517594277

Author:

David Ray

ISBN #:

0399218742

Author:

David Ray

ISBN #:

0399219617

Author:

David Ray

ISBN #:

0399219242

Author:

David Ray

ISBN #:

0399220283