Daniel Aaron Rosenthal

US Patent:

7544938, Jun 9, 2009

Filed:

Jul 6, 2006

Appl. No.:

11/481574

Inventors:

Diane K. Stewart - Ipswich MA, US
Daniel Rosenthal - Boxford MA, US
Michel Epsztein - Lexington MA, US

Assignee:

FEI, Company - Hillsboro OR

International Classification:

G01N 23/05

US Classification:

250310, 250306, 250309, 250311, 977840, 977842, 977849, 977880, 977881

Abstract:

A method and apparatus for determining statistical characteristics of nano-particles includes distributing the nano-particles over a surface and then determining properties of the nano-particles by automatic measurement of multiple particles or by a measurement that determines properties of multiple particles at one time, without manipulating individual nano-particles.

US Patent:

7719446, May 18, 2010

Filed:

Nov 14, 2008

Appl. No.:

12/271436

Inventors:

Daniel A. Rosenthal - Boxford MA, US
Corey A. Nazarian - Cambridge MA, US

Assignee:

Teradyne, Inc. - North Reading MA

International Classification:

H03M 7/00

US Classification:

341 61, 375355, 708313

Abstract:

The invention allows the interpolation factor, a critical parameter in sample rate conversion systems, to be computed in a real-time system where there is a complex relationship between a DSP clock and the data clocks. Typically, two or three of the clocks in such a system will have simple relationships (such as CLOCK=2*CLOCK). This relationship leads to degenerate cases where, in fact, there are only one or two clocks to consider rather than three. Furthermore, the invention allows for input data rates that are higher than the DSP clock rate. The invention also provides for an arbitrary time delay to be applied to the output signal.

US Patent:

8119985, Feb 21, 2012

Filed:

May 8, 2009

Appl. No.:

12/463285

Inventors:

Diane K. Stewart - Ipswich MA, US
Daniel Rosenthal - Boxford MA, US
Michel Epsztein - Lexington MA, US

Assignee:

FEI Company - Hillsboro OR

International Classification:

G01N 23/05

US Classification:

250310, 250251, 250306, 250309, 250311, 977840, 977842, 977849, 977880, 977881

Abstract:

A method and apparatus for determining statistical characteristics of nano-particles includes distributing the nano-particles over a surface and then determining properties of the nano-particles by automatic measurement of multiple particles or by a measurement that determines properties of multiple particles at one time, without manipulating individual nano-particles.

US Patent:

55128955, Apr 30, 1996

Filed:

Apr 25, 1994

Appl. No.:

8/232604

Inventors:

Timothy J. Madden - Malden MA
Daniel A. Rosenthal - Saratoga CA

Assignee:

Teradyne, Inc. - Boston MA

International Classification:

H03M 700

US Classification:

341 61

Abstract:

Method and apparatus for digital sample rate conversion. A mixed signal tester employing digital sample rate conversion is also disclosed. According to the invention, variable phase jitter is introduced into an input digital signal to produce an intermediate signal at a second sampling rate. The intermediate signal is then low pass filtered to produce the output signal. This technique is used in a mixed signal tester where one period of a stimulus signal is stored in a digital memory. The frequency of the analog stimulus signal is dictated by the rate at which the digital signal is retrieved from the memory. Sample rate conversion is used to convert the signal retrieved from memory, regardless of the rate at which it was retrieved, to the sampling rate for which a digital to analog converter has been calibrated.

US Patent:

20170163358, Jun 8, 2017

Filed:

Dec 7, 2015

Appl. No.:

14/946311

Inventors:

- North Reading MA, US
Daniel Rosenthal - Boxford MA, US

International Classification:

H04B 17/29
H04B 1/10

Abstract:

Example automatic test equipment (ATE) includes: a test instrument for outputting test signals to test a device under test (DUT), and for receiving output signals from the DUT, with the test instrument including a front-end module, and with the front-end module including internal circuitry for performing functions relating to the DUT; and external circuitry for performing the functions relative to the DUT via the test instrument, with the external circuitry being external to the front-end module and being shared among multiple front-end modules or channels of the test instrument. The test instrument is configurable to use either (i) the internal circuitry, (ii) the external circuitry, or (iii) a combination of circuits in the internal circuitry and the external circuitry to perform the functions.

US Patent:

20160245900, Aug 25, 2016

Filed:

Feb 19, 2015

Appl. No.:

14/626252

Inventors:

- North Reading MA, US
Daniel A. Rosenthal - Boxford MA, US

Assignee:

Teradyne, Inc. - North Reading MA

International Classification:

G01S 7/40

Abstract:

A testing device for testing a radar device. The testing device may be configured to determine a first frequency difference between a frequency of a first signal or a second signal and a frequency of a third signal based on a first distance value; transmit to the radar device the first signal; receive the second signal from the radar device; transmit to the radar device the third signal at an offset relative to at least one of the first signal and the second signal based on the first frequency difference; and receive from the radar device a fourth signal indicating a second distance value or a second frequency difference between the frequency of the second signal and the frequency of the third signal, determined by the radar device, for comparison with the first distance value or the first frequency difference.

Author:

Daniel I. Rosenthal

ISBN #:

0721646093

Author:

Daniel Rosenthal

ISBN #:

0600601153

Author:

Daniel Rosenthal

ISBN #:

0713683295

Author:

Daniel Rosenthal

ISBN #:

0865777853

Author:

Daniel Rosenthal

ISBN #:

0938689002

Author:

Daniel Rosenthal

ISBN #:

0938689029

Author:

Daniel Rosenthal

ISBN #:

0938689053

Author:

Daniel Rosenthal

ISBN #:

0938689061