Christopher J Many

US Patent:

8218141, Jul 10, 2012

Filed:

Jul 19, 2010

Appl. No.:

12/838804

Inventors:

Oleg Zimenkov - South Burlington VT, US
Xavier Amouretti - Essex Junction VT, US
Robert M. Gifford - Starksboro VT, US
Mark R. Kennedy - South Burlington VT, US
Michael Kontorovich - Colchester VT, US
Ben Norris - Monkton VT, US
Richard N. Sears - Jericho VT, US
Dan Venditti - Colchester VT, US
Christopher Many - Highgate VT, US

Assignee:

BTI Holdings, Inc. - Winooski VT

International Classification:

G01J 3/18
G01J 3/42
G01J 3/44
G01N 21/64

US Classification:

356319, 356301, 356316, 356317, 356318, 356333, 422 8208, 436172

Abstract:

An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.

US Patent:

20080191149, Aug 14, 2008

Filed:

May 25, 2007

Appl. No.:

11/802831

Inventors:

Oleg Zimenkov - South Burlington VT, US
Xavier Amouretti - Essex Junction VT, US
Robert M. Gifford - Starksboro VT, US
Mark R. Kennedy - South Burlington VT, US
Michael Kontorovich - Colchester VT, US
Ben Norris - Monkton VT, US
Richard N. Sears - Jericho VT, US
Dan Venditti - Colchester VT, US
Christopher Many - Highgate VT, US

International Classification:

G01J 3/30
G21G 5/00

US Classification:

2504921, 356318

Abstract:

An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.

US Patent:

20120300194, Nov 29, 2012

Filed:

May 31, 2012

Appl. No.:

13/485446

Inventors:

Oleg ZIMENKOV - South Burlington VT, US
Xavier AMOURETTI - Essex Junction VT, US
Michael KONTOROVICH - Colchester VT, US
Ben NORRIS - Monkton VT, US
Richard N. SEARS - Jericho VT, US
Christopher MANY - Highgate VT, US
Bill Anderson - Westford VT, US
Ben Knight - Burlington VT, US
James Piette - Winooski VT, US
Ross Piette - Essex Junction VT, US
Joe Tobey - Essex VT, US
Brian Ferris - Georgia VT, US

Assignee:

BTI HOLDINGS, INC. - Winooski VT

International Classification:

G01N 21/64
G01N 21/59
H01L 27/146

US Classification:

356 72, 2502081, 356432, 2504581

Abstract:

An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.

US Patent:

20170108438, Apr 20, 2017

Filed:

Dec 23, 2016

Appl. No.:

15/390128

Inventors:

- Winooski VT, US
Xavier AMOURETTI - Essex Junction VT, US
Michael KONTOROVICH - Colchester VT, US
Ben NORRIS - Monkton VT, US
Richard N. SEARS - Jericho VT, US
Christopher MANY - Highgate VT, US
Bill ANDERSON - Westford VT, US
Ben KNIGHT - Burlington VT, US
James PIETTE - Winooski VT, US
Ross PIETTE - Essex VT, US
Joe TOBEY - Essex VT, US
Brian FERRIS - Georgia VT, US

Assignee:

BTI HOLDINGS, INC. - Winooski VT

International Classification:

G01N 21/64
G01N 21/76

Abstract:

An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.