The program circuit according to the present invention can apply a program voltage to the only memory cells which are not programmed during a re-programming operation, thus, the present invention can be prevent a lowering of reliability of the memory cell due to a continued supply of a program bias voltage.
Circuit For Regulating Leakage Current In Charge Pump
- Wuhan, CN Bin SHENG - Wuhan, CN Byoung Kwon CHA - San Jose CA, US Yi XU - Wuhan, CN Jen-Tai HSU - San Jose CA, US
International Classification:
G11C 16/30 G11C 16/14 G05F 3/20 H02M 3/07
Abstract:
A circuit for regulating a leakage current in a charge pump is disclosed. The circuit includes a bias voltage generating circuit and a first transistor, wherein: the bias voltage generating circuit generates a bias voltage that is proportional to a supply voltage; a gate of the first transistor is coupled to the bias voltage; the first transistor has a drain that is coupled to an output of the charge pump and a source that is grounded; a voltage the drain of the first transistor is proportional to the supply voltage; and a current flowing through the source and drain of the first transistor is proportional to the supply voltage that powers the charge pump.
- Wuhan, CN Zhifeng MAO - Wuhan, CN Yi LUO - Wuhan, CN Byoung Kwon CHA - San Jose CA, US Jen-Tai HSU - San Jose CA, US
International Classification:
H02M 3/07
Abstract:
A charge pump is disclosed, including: multiple charge-pump stages connected sequentially; multiple switches, coupled between output of a corresponding one of charge-pump stages and output of charge pump; multiple second switches, coupled, at one end, to output of a corresponding one of charge-pump stages and to input of immediately succeeding one of charge-pump stages at other end; and multiple third switch, coupled between output of corresponding one of charge-pump stages and input of charge pump. First, second and third switches are opened or closed to determine a number of charge-pump stages connected in series and a number of charge-pump stages connected in parallel. The greater the number of charge-pump stages connected in series in charge-pump cascade is, the higher output voltage of charge pump will be, and the greater the number of charge-pump stages connected in parallel in charge-pump cascade, the higher drive current produced by charge pump will be.
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