Abstract:
A testing system for testing an integrated circuit device includes a test definition generator program which generates an initial test definition from information that includes test data. A checker program checks the initial test definition for compatibility with each of at least two different testers. Each of the testers includes a hardware interface, native software having driver routines for the associated hardware interface, and a compiler compatible with the driver routines. Each tester includes a converter program which has been compiled by a compiler other than the native compiler, and which converts the initial test definition into a modified test definition. The modified test definition is interpreted by an interpreter program, which has been compiled by the native compiler, and which controls the hardware interface through the native driver routines so as to carry out the test definition.