Aram P Schiffman

US Patent:

7016087, Mar 21, 2006

Filed:

Aug 8, 2001

Appl. No.:

09/925124

Inventors:

David M. Heffelfinger - Oakland CA, US
Aram P. Schiffman - San Ramon CA, US
Bala S. Manian - Los Altos Hills CA, US

Assignee:

Becton Dickinson and Company - Franklin Lakes NJ

International Classification:

H04N 1/04

US Classification:

358474, 358484, 2504581, 2504591, 2504611

Abstract:

A system for optical interrogation of a sample adaptable for multiple wavelength illumination and multiple wavelength fluorescent or luminescent light collection, wherein the illumination wavelength profile and the light collection profile may overlap. In the system, coherent light from one or more lasers is focused onto a target layer on a sample to excite fluorescent or luminescent light from the target layer. Emitted light is collected from a selected depth by a reflective light collector that transmits the collected light to detection optics. The reflective light collector directs collected light at an angle to the optical axis of the illumination light, thereby separating collected emitted light from illumination light. The light collector may collect light from a focus, whereby the focused illumination light combined with the focused light collection aid in limitation of the depth of field to a selected depth. Additionally, a spatial filter positioned between the light collector and the detection optics may be used to confine the depth of field to a selected depth.

US Patent:

20030044967, Mar 6, 2003

Filed:

Aug 29, 2001

Appl. No.:

09/942472

Inventors:

David Heffelfinger - Oakland CA, US
Aram Schiffman - San Ramon CA, US
Bala Manian - Los Altos Hills CA, US

International Classification:

C12M001/34
G01J003/42
G01J003/427

US Classification:

435/287200, 356/319000

Abstract:

An apparatus and method in which illumination light and collected emitted light share a pathway and subsequently are physically separated. The optical configuration is designed such that at the point of separation, the illumination light is at has a smaller cross sectional area than the collected light. Collected light is directed away from the pathway of the illumination light and to detection optics. This configuration is adaptable to illumination and light collection across a broad wavelength spectrum. This configuration is adaptable to scanning in a limited depth of field to allow high throughput optical analysis of samples.