Amir Leber

US Patent:

20070101223, May 3, 2007

Filed:

Oct 25, 2006

Appl. No.:

11/586370

Inventors:

Christian Chetreanu - Munchen, DE
Stefan Gollmer - Munchen, DE
Amir Leber - Cary NC, US
Roman Mayr - Munchen, DE

International Classification:

G01R 31/28

US Classification:

714731000

Abstract:

An electronic test apparatus for testing at least one circuit unit comprises a clock signal generator for generating a clock signal, a driver device comprising a plurality of driver subunits each generating a phase-shifted driver signal in response to said clock signal, a processing device for processing the phase-shifted driver signals and for comparing actual data being output by at least one circuit unit with desired data generated in the processing device, a connecting device for connecting the processing device to the at least one circuit unit and for transmitting the phase-shifted driver signals, the desired data, and the actual data between the processing device and the at least one circuit unit, and a combinational logic device for combining the phase-shifted driver signals to form a clock combination signal.

Address:

7264 Bedford Rdg Dr, Apex, NC 27539

VIN:

1G1AK55F477186838

Make:

CHEVROLET

Model:

COBALT

Year:

2007